Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2007-08-28
2007-08-28
Beausoliel, Robert (Department: 2113)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S005110, C714S042000
Reexamination Certificate
active
10852116
ABSTRACT:
An integrated circuit, in particular, an integrated memory, contains a control circuit for ascertaining an operating state of the circuit. A self-repair circuit, which is connected to the control circuit, is used to implement self-test and self-repair operation for checking the functioning of, and repairing, defective circuit sections of the integrated circuit. After a supply voltage has been applied to the integrated circuit, the control circuit ascertains an operating state of the integrated circuit and, in a manner dependent thereon, the self-repair circuit is activated by the control circuit in a self-controlling manner in order to put the integrated circuit into a self-repair mode for implementing self-test and self-repair operation. The integrated circuit can be tested for its functionality and repaired even after being soldered onto a module substrate.
REFERENCES:
patent: 5956350 (1999-09-01), Irrinki et al.
patent: 6085334 (2000-07-01), Giles et al.
patent: 6397349 (2002-05-01), Higgins et al.
patent: 6408401 (2002-06-01), Bhavsar et al.
patent: 6496947 (2002-12-01), Schwarz
patent: 6505308 (2003-01-01), Schwarz
patent: 6662136 (2003-12-01), Lamb et al.
patent: 6766468 (2004-07-01), Barth et al.
patent: 6976198 (2005-12-01), Vaida
patent: 7053470 (2006-05-01), Sellers et al.
patent: 7085971 (2006-08-01), Barth et al.
patent: 2001/0054164 (2001-12-01), Tanizaki et al.
patent: 2003/0070118 (2003-04-01), Nakao et al.
patent: 2003/0107925 (2003-06-01), Koss et al.
patent: 2003/0177415 (2003-09-01), Togashi et al.
patent: 2004/0064767 (2004-04-01), Huckaby et al.
patent: 2004/0230870 (2004-11-01), Wang et al.
patent: 2004/0260975 (2004-12-01), Nagura
Pröll Manfred
Schröder Stephan
Stavrou Evangelos
van der Zanden Koen
Beausoliel Robert
Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Manoskey Joseph D.
LandOfFree
Integrated circuit, in particular integrated memory, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated circuit, in particular integrated memory, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit, in particular integrated memory, and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3900338