4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Koen van der Zanden

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Integrated circuit, in particular integrated memory, and...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Memory device having cross-shaped semiconductor fin structure

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Method for testing an integrated semiconductor memory

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3026952

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