Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2007-10-10
2011-10-25
Riad, Amine (Department: 2113)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
Reexamination Certificate
active
08046634
ABSTRACT:
An integrated circuit card includes a central processing unit, a memory and an abnormal condition detector. The memory stores data to be processed by the central processing unit. The abnormal condition detector detects whether at least one operating condition of the integrated circuit card is within one of a suspend region or a reset region. The abnormal condition detector controls an operation of the central processing unit in accordance with the detection.
REFERENCES:
patent: 5203000 (1993-04-01), Folkes et al.
patent: 5557739 (1996-09-01), Gupta et al.
patent: 5864656 (1999-01-01), Park
patent: 6047248 (2000-04-01), Georgiou et al.
patent: 6714891 (2004-03-01), Dendinger
patent: 7159153 (2007-01-01), Kim
patent: 7716528 (2010-05-01), Hayem
patent: 7761274 (2010-07-01), Pippin
patent: 2003/0149914 (2003-08-01), Kim
patent: 09-054710 (1997-02-01), None
patent: 2001-242901 (2001-09-01), None
patent: 2005-165470 (2005-06-01), None
patent: 2006-085516 (2006-03-01), None
patent: 1020060003434 (2006-01-01), None
patent: 1020060034995 (2006-04-01), None
Kim Ki-Hong
Kim Sun-Kwon
Lee Byeong-Hoon
Riad Amine
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
LandOfFree
Integrated circuit card with condition detector does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Integrated circuit card with condition detector, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit card with condition detector will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4281168