Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent
1997-09-30
1999-04-06
Thomas, Tom
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
257750, 257751, H01L 2976, H01L 2994, H01L 2348, H01L 2352
Patent
active
058922547
ABSTRACT:
A barrier layer is included in an integrated circuit capacitor, between a conductive plug and a lower capacitor electrode. The barrier layer includes refractory metal and grain boundary filling material. The grain boundary filling material preferably is Ce, Zr, Y, Th, Hf, La, Al and/or oxides thereof, and is preferably less that 20 atomic percent of the barrier layer. The barrier layer can reduce and preferably prevent diffusion of oxygen, and can thereby reduce the leakage current and oxidation of the integrated circuit capacitor.
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Lesaicherre et al., "A Gbit-Scale DRAM Stacked Capacitor With ECR MOCVD SrTiO.sub.3 Over RIE Patterned RuO.sub.2 /TiN Storage Nodes", Integrated Ferroelectrics, vol. 11, 1995, pp. 81-100.
"At IEDM, Mitsubishi discusses 1-Gbit process; x-ray litho used", Solid State Technology, Dec. 1995, p. 36.
Lee Sang-in
Paik Hong-ku
Park Chang-soo
Nguyen Cuong Quang
Samsung Electronics Co,. Ltd.
Thomas Tom
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