Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-04-18
2008-03-04
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07340710
ABSTRACT:
A method for binning and layout of an integrated circuit design which includes providing a table setting forth predefined widths of signal wires and corresponding spacing to shield wires, characterizing effects on timing, noise, and power distribution based on predefined widths and spacing combinations as functions of the length of the signal wire, and laying out the integrated circuit design based upon the predefined widths of signal wires and corresponding spacing to shield wires. The shield wires are adjacent and on both sides of the routed signal wire.
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Dutt Arjun
Hoerold Stephan
Dimyan Magid Y.
Dorsey & Whitney LLP
Sun Microsystems Inc.
Whitmore Stacy A
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