Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-11-15
2005-11-15
Dildine, R. Stephen (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C716S030000
Reexamination Certificate
active
06966019
ABSTRACT:
An automatic test system transfers measure data from one or more test instruments to a processor and processes the measure data, the packaging, transfer, and the processing of the measure data initiated by the one or more test instruments. A method for testing a device under test includes capturing measure data with a test instrument, and initiating, with the test instrument, operation upon the measure data. The operations include packaging the measure data to provide packaged data, and transferring the packaged data to a switching/processing circuit for processing. A method of manufacturing an electronic circuit includes fabricating the electronic circuit and testing the electronic circuit with the aforementioned method.
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Brown Gregory P.
Klein Larry
Labonte Francois
Viens Dominic
Dildine R. Stephen
Teradyne, Inc.
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