Instruction-based built-in self-test (BIST) of external memory

Details Instruction-based built-in self-test (BIST) of external memory Instruction-based built-in self-test (BIST) of external memory

2006-03-28

2006-03-28

Tu, Christine T. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S717000, C714S046000

Reexamination Certificate

active

07020820

ABSTRACT:
Disclosed are novel methods and apparatus for efficiently providing instruction-based BIST of external memory. In an embodiment, a built-in self-testing system is disclosed. The system includes an external memory module, an on-chip memory controller coupled to the external memory module, an on-chip built-in self-test (BIST) module coupled to the on-chip memory controller, and an interface controller coupled to the BIST module to provide an interface to access the BIST module. The on-chip memory controller may send and receive data to and from the external memory module. And, the BIST module may include an instruction register to store a plurality of instructions.

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