Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-02-08
2005-02-08
Chung, Phung My (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S010000, C714S797000
Reexamination Certificate
active
06854081
ABSTRACT:
A semiconductor chip of the present invention includes a plurality of first elements each of which diagnoses itself, and a second element which inputs diagnosis results from the first elements and determines whether or not there is a faulty first element in the first elements. A method of the present invention which is performed in a semiconductor chip including a plurality of first elements, includes diagnosing the first elements by itself; and determining whether or not there is a faulty first element in the first elements based on diagnosis results from the first elements.
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Chung Phung My
NEC Corporation
Sughrue & Mion, PLLC
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