In-situ doped rough polysilicon storage cell structure formed us

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438398, 438964, H01L 218234, H01L 218242

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active

060603542

ABSTRACT:
A method for forming a semiconductor memory device storage cell structure having an increased surface area. The storage cell structure has one or more rough polysilicon surfaces formed by depositing the polysilicon under conditions that result in gas phase dominant nucleation.

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