Impedance calibration circuit and semiconductor device...

Details Impedance calibration circuit and semiconductor device... Impedance calibration circuit and semiconductor device...

2007-09-12

2008-08-05

Le, Don P (Department: 2819)

Electronic digital logic circuitry

Signal sensitivity or transmission integrity

Bus or line termination

C326S083000

Reexamination Certificate

active

07408379

ABSTRACT:
An impedance calibration circuit and a semiconductor device including the same are provided. An embodiment of the invention provides an impedance calibration circuit with a variable reference voltage generation unit. The impedance calibration circuit maximizes the number of semiconductor devices that can be tested in test equipment at one time and permits the operation of an impedance matching unit (e.g., an on-die-termination (ODT) circuit and/or an off-chip-driver (OCD)) to be tested for a variety of reference resistor values.

REFERENCES:
patent: 2003/0218477 (2003-11-01), Jang et al.
patent: 2008/0001623 (2008-01-01), Kim
patent: 2008/0048714 (2008-02-01), Lee et al.
patent: 2008/0054981 (2008-03-01), Hosoe et al.
patent: 2008/0061818 (2008-03-01), Santurkar et al.
patent: 1020040004792 (2004-01-01), None
patent: 1020040021110 (2004-03-01), None
patent: 1020050012931 (2005-02-01), None
patent: 1020050019453 (2005-03-01), None

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