Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface
Patent
1987-12-17
1990-02-20
Dees, Jose G.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Forming nonplanar surface
430326, 354317, 354320, 354324, 354330, G03C 500
Patent
active
049026089
ABSTRACT:
A method of processing semiconductor wafers to develop photoresist patterns which includes mounting a semiconductor on a vacuum chuck, immersing and spinning the semiconductor wafer in a developer fluid, removing the semiconductor wafer from the semiconductor wafer from the developer fluid, lowering the semiconductor wafer into the rinse bath, then removing the semiconductor wafer from the rinse bath and spin drying it.
REFERENCES:
patent: 4136940 (1979-01-01), Lin
patent: 4429983 (1984-02-01), Cortellino et al.
Bittancourt Alan R.
Daugherty Harvey S.
Haikl Vojtech
Kowaleski Jerome L.
Lamb William E.
Barndt B. Peter
Comfort James T.
Dees Jos,e G.
Sharp Melvin
Texas Instruments Incorporated
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