Illumination system for x-ray lithography

X-ray or gamma ray systems or devices – Specific application – Lithography

Patent

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Details

378156, 378159, 2505031, G21K 300

Patent

active

048316407

ABSTRACT:
This invention is directed to an improvement in an x-ray lithography system having an x-ray point source of radiation, a wafer disposed in spaced relationship with respect to the source, and a mask disposed between the source and the wafer whereby radiation from the source passes through the mask to the wafer, said improvement comprising the provision of an x-ray absorbent element mounted between the source and the wafer, said element having a radial absorption gradient profile to compensate for radial flux variation of the x-rays.

REFERENCES:
patent: 4006361 (1977-02-01), Schriber
patent: 4288695 (1981-09-01), Walters et al.

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