4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Statistical measurement

Edmund L. Russell

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Identifying semiconductor system specification violations

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate

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Method of predicting reliabilty of oxide-nitride-oxide based...

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate

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Specification window violation identification with...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2753272

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