Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2004-08-27
2008-03-18
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
07346821
ABSTRACT:
An IC includes an IEEE 1149.1 standard test access port (TAP) interface and an additional Off-Chip TAP interface. The Off-Chip TAP interface connects to the TAP of another IC. The Off Chip TAP interface can be selected by a TAP Linking Module on the IC.
REFERENCES:
patent: 6378090 (2002-04-01), Bhattacharya
patent: 6408413 (2002-06-01), Whetsel
patent: 6804725 (2004-10-01), Whetsel
Bassuk Lawrence J.
Brady W. James
Britt Cynthia
Telecky , Jr. Frederick J.
Texas Instrument Incorporated
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