Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-06-20
2006-06-20
Whitmore, Stacy A. (Department: 2825)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S030000, C714S727000, C716S030000
Reexamination Certificate
active
07065692
ABSTRACT:
An integrated circuit carries an intellectual property core. The intellectual property core includes a test access port39with test data input leads15, test data output leads13, control leads17and an external register present, ERP lead37. A scan register25encompasses the intellectual property core and ERP lead37carries a signal indicating the presence of the scan register.
REFERENCES:
patent: 5862152 (1999-01-01), Handly et al.
patent: 6173428 (2001-01-01), West
patent: 6223315 (2001-04-01), Whetsel
patent: 6558615 (2003-05-01), Jungblut
Bassuk Lawrence J.
Brady W. James
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Whitmore Stacy A.
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