Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-06-20
2010-02-23
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07669159
ABSTRACT:
The invention provides a method for providing an integrated circuit (6) having a substantially uniform density between parts (10, 12, 14and16) of the IC that are non-orthogonally angled. In particular, the invention provides fill tiling patterns (32, 34) oriented substantially parallel to electrical structure regardless of their angle. A method of electrical analysis based on this provision is also provided as is a related program product.
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Allen Robert J.
Cohn John M.
Habitz Peter A.
Leipold William
Wemple Ivan
Blecker Ira D.
Chiang Jack
International Business Machines - Corporation
Tat Binh C
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