I/O stress test

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Details

C714S030000, C710S007000

Reexamination Certificate

active

06898734

ABSTRACT:
The present invention provides a method, computer program product, input/output device, and computer system for stress testing the I/O subsystem of a computer system. An input/output device capable of engaging in repetitive direct memory access (DMA) transfers with pseudo-randomized transfer parameters is allowed to execute multiple DMA transfers with varying parameters. In this way, a single type of device may be used to simulate the effects of multiple types of devices. Multiple copies of the same I/O device may be used concurrently in a single computer system along with processor software to access the same portions of memory. In this way, false sharing, true sharing may be effected.

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IBM Technical Disclosure Bulletin, “Microprocessor-Based Attachement Device to a Hardware Stimulator”, vol. 34, No. 3, Aug. 1991.

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