Hybrid scan-based delay testing technique for compact and...

Details Hybrid scan-based delay testing technique for compact and... Hybrid scan-based delay testing technique for compact and...

2007-12-25

2007-12-25

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000

Reexamination Certificate

active

10653959

ABSTRACT:
A scan-based method for testing delay faults in a circuit comprising controlling a subset of state inputs of the circuit by a skewed-load approach and controlling all inputs other than said subset of state inputs by a broad-side approach.

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