High-voltage metal-oxide-semiconductor devices and method of...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S199000, C438S218000, C438S529000

Reexamination Certificate

active

07067365

ABSTRACT:
An improved high-voltage process is disclosed. In order to improve the performance in terms of breakdown voltage and to maintain the integrity of the STI structures, the thick gate oxide layer of the high-voltage device area is not etched back before a high-dosage ion doping process. One photo mask is therefore omitted.

REFERENCES:
patent: 6740939 (2004-05-01), Sayama et al.
patent: 2002/0125512 (2002-09-01), Hino et al.
patent: 2005/0164439 (2005-07-01), Takamura

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