High-speed serial transfer device test method, program, and...

Details High-speed serial transfer device test method, program, and... High-speed serial transfer device test method, program, and...

2006-04-06

2010-12-14

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S798000

Reexamination Certificate

active

07853849

ABSTRACT:
A test pattern generating unit generates a test pattern in which unconverted data is arranged such that same values of 0 or 1 bits in converted data according to a code conversion table are successively transferred to each of a plurality of serial transfer channels that a high-speed serial transfer device has. A basic pattern setting unit sets a basic pattern while considering a byte order method and an RD value of code conversion in the high-speed serial transfer device. A basic pattern resetting unit resets the basic pattern in accordance with a channel usage method of a bit transfer order in the high-speed serial transfer device. A basic pattern rearranging unit performs rearrangement such that the basic pattern is transferred to each of the channels in accordance with the number of used channels and a channel usage method such as bit transfer order in the high-speed serial transfer device.

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“What is a pseudorandom number sequence?”, URL: http://infohost.nmt.edu/tcc/help/lang/fortran/pseudo.html, Dec. 19, 2005.

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