Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1998-08-26
2000-03-14
Kim, Robert H.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
356382, G01B 1106
Patent
active
060380284
ABSTRACT:
An optical measurement apparatus is provided for measuring the thickness of a moving sheet material (18). The apparatus has a pair of optical measurement systems (21, 31) attached to opposing surfaces (14, 16) of a rigid support structure (10). A pair of high-power laser diodes (20,30) and a pair of photodetector arrays (22,32) are attached to the opposing surfaces. Light emitted from the laser diodes is reflected off of the sheet material surfaces (17, 19) and received by the respective photodetector arrays. An associated method for implementing the apparatus is also provided.
REFERENCES:
patent: 5210593 (1993-05-01), Kramer
patent: 5581353 (1996-12-01), Taylor
Gopel, W., Hesse, J. and Zemel, J.N., A Comprehensive Survey, vol. 6, Optical Sensors, 1992, pp. 566-570.
Grann Eric B.
Holcomb David E.
Kim Robert H.
Lockheed Martin Energy Research Corp.
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