Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-03-22
2005-03-22
Pham, Long (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S328000, C257S492000
Reexamination Certificate
active
06870223
ABSTRACT:
A semiconductor device is configured to prevent destruction of elements and/or miss-operation of the circuit by parasitic effects produced by parasitic transistors when a MOSFET of a bridge circuit is formed on a single chip. A Schottky junction is formed by providing an anode electrode in an n well region where a source region, a drain region, and a p well region of a lateral MOSFET. A Schottky barrier diode constituting a majority carrier device is connected in parallel with a PN junction capable of being forward-biased so that the PN junction is not forward-biased so that minority carriers are not generated, and thereby suppressing parasitic effects.
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patent: 5925910 (1999-07-01), Menegoli
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patent: 6242787 (2001-06-01), Nakayama et al.
patent: 10-284731 (1998-10-01), None
Fujihira Tatsuhiko
Harada Yuuichi
Ikura Yoshihiro
Jimbo Shinichi
Kumagai Naoki
Fuji Electric & Co., Ltd.
Pham Long
Pizarro-Crespo Marcos D.
Rossi, Kimms & McDowel
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