Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1993-07-28
1995-04-11
Beck, Shrive
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
427575, 427577, C23C 1650
Patent
active
054056454
ABSTRACT:
A process for depositing diamond on a substrate using a microwave plasma generator including providing carbon, hydrogen and oxygen in a desired ratio to the microwave plasma generator, and providing sufficient microwave power to the microwave plasma generator to produce a greenish-colored plasma with the C.sub.2 emission at 5165 Angstroms (.ANG.) at a level of from 0.5 to 50 times the atomic hydrogen alpha emission level at 6563 .ANG., for depositing high quality diamond at an extremely high rate on the substrate placed proximate or in the plasma.
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patent: 4816286 (1989-03-01), Hirose
patent: 4937095 (1990-06-01), Fukatsu et al.
patent: 4957591 (1990-09-01), Sato et al.
patent: 5110577 (1992-05-01), Tamor et al.
Bourget Lawrence P.
Post Richard S.
Sevillano Evelio
Applied Science and Technology Inc.
Beck Shrive
Chen Bret
Iandiorio Joseph S.
Kirk Teska
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