Teska Kirk

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Details Teska Kirk Teska Kirk

: Coating processes
: Measuring, testing, or indicating
: Thickness or uniformity of thickness determined

: Representative
: active

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High growth rate plasma diamond deposition process and method of

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined

Patent

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Profile ID: LFUS-PAI-P-1527806

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