Heavily-doped polysilicon/germanium thin film formed by laser an

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438305, 438300, 438303, H01L 218234

Patent

active

061272167

ABSTRACT:
An ultra-large scale integrated (ULSI) circuit includes MOSFETs which have different threshold voltages and yet have the same channel characteristics. The MOSFETs utilize gate structures with heavily doped polysilicon material or heavily doped polysilicon/germanium material. The polysilicon and polysilicon/germanium materials are manufactured by utilizing amorphouse semiconductor layers. Excimer laser annealing is utilized to activate the dopants and to provide a box-like dopant profile.

REFERENCES:
patent: 5290727 (1994-03-01), Jain
patent: 5670397 (1997-09-01), Chang
patent: 5851922 (1998-12-01), Bevk
patent: 5902125 (1999-05-01), Wu

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Heavily-doped polysilicon/germanium thin film formed by laser an does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Heavily-doped polysilicon/germanium thin film formed by laser an, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Heavily-doped polysilicon/germanium thin film formed by laser an will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-194614

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.