Growth of GaN on a substrate using a ZnO buffer layer

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Plural fluid growth steps with intervening diverse operation

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438478, 438479, 438482, 438483, 117952, H01L 2120

Patent

active

060308869

ABSTRACT:
To present a manufacturing method of semiconductor device capable of forming a homogeneous and highly reproducible gallium nitride crystal, comprising the steps of forming a zinc oxide layer on a monocrystalline substrate, forming a first gallium nitride crystal in a temperature range from 0.degree. C. to 900.degree. C., and forming a second gallium nitride crystal in a temperature range from 900.degree. C. to 2000.degree. C.

REFERENCES:
patent: 4473938 (1984-10-01), Kobayashi et al.
patent: 5278435 (1994-01-01), Van Hove et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Growth of GaN on a substrate using a ZnO buffer layer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Growth of GaN on a substrate using a ZnO buffer layer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Growth of GaN on a substrate using a ZnO buffer layer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-682546

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.