Generating test input for a circuit

Details Generating test input for a circuit Generating test input for a circuit

2003-01-16

2008-09-02

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

07421637

ABSTRACT:
Generating test input includes initializing a current pseudo-random value at a test input generator coupled to a circuit component. Write data is received from the circuit component. The following are repeated to generate next pseudo-random values as test input. The current pseudo-random value and the write data are retrieved. A next pseudo-random value is generated from the current pseudo-random value and the write data according to a generation function. The next pseudo-random value is transferred to the circuit component as the test input.

REFERENCES:
patent: 4771429 (1988-09-01), Davis et al.
patent: 5258936 (1993-11-01), Gallup et al.
patent: 5369648 (1994-11-01), Nelson
patent: 5383143 (1995-01-01), Crouch et al.
patent: 5416783 (1995-05-01), Broseghini et al.
patent: 5610926 (1997-03-01), Marris
patent: 5619512 (1997-04-01), Kawashima et al.
patent: 5787094 (1998-07-01), Cecchi et al.
patent: 6393594 (2002-05-01), Anderson et al.
patent: 6438722 (2002-08-01), Bailey et al.
patent: 6530057 (2003-03-01), Kimmitt
patent: 6701476 (2004-03-01), Pouya et al.
patent: 6766493 (2004-07-01), Hoffman et al.
patent: 6807646 (2004-10-01), Williams et al.
patent: 7197681 (2007-03-01), Dervisoglu et al.
Kagaris, Tragoudas, Generating Deterministic Unordered Test Patterns with Counters, 1996, IEEE, 14thVLSI Test Symposium, pga 374-379.
C. Barnhart et al., “OPMISR: The Foundation for Compressed ATPG Vectors,” IEEE ITC International Test Confen:nce, Paper 27.4, pp. 748-757, Oct. 30-Nov. 1, 2001.

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