Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-08-02
2011-08-02
Dickey, Thomas L (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE29345, C438S583000
Reexamination Certificate
active
07989892
ABSTRACT:
A gate structure can include a polysilicon layer, a metal layer on the polysilicon layer, a metal silicide nitride layer on the metal layer and a silicon nitride mask on the metal silicide nitride layer.
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Baek Jong-Min
Cha Tae-Ho
Cheong Seong-Hwee
Choi Gil-heyun
Kim Byung-hee
Dickey Thomas L
Myers Bigel Sibley & Sajovec P.A.
Samsung Electronics Co,. Ltd.
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