Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-10-03
2006-10-03
Fourson, George R. (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S257000, C438S264000, C438S265000, C438S266000, C438S267000, C257SE29129, C257SE21179
Reexamination Certificate
active
07115458
ABSTRACT:
Methods and apparatus utilizing a stepped floating gate structure to facilitate reduced spacing between adjacent cells without significantly impacting parasitic capacitance. The stepped structure results in a reduced surface area of a first floating gate in close proximity to an adjacent floating gate with substantially no reduction in coupling area, thus facilitating a reduction in parasitic capacitance leading to improved gate coupling characteristics. Also, because of the reduced surface area exposed to adjacent floating gates, the floating gates may be formed with reduced spacing, thus further leading to improved gate coupling characteristics.
REFERENCES:
patent: 6602750 (2003-08-01), Kao
patent: 2004/0014269 (2004-01-01), Kim et al.
patent: 2005/0082596 (2005-04-01), Lin et al.
patent: 2005/0142765 (2005-06-01), Joo
patent: 2005/0186739 (2005-08-01), Wang et al.
patent: 2005/0199939 (2005-09-01), Lutze
patent: 2005/0245029 (2005-11-01), Choi et al.
patent: 2006/0024885 (2006-02-01), Sandhu
patent: 2006/0081908 (2006-04-01), Smayling
patent: 2006/0121674 (2006-06-01), Jeno et al.
Fourson George R.
Leffert Thomas W.
Leffert Jay & Polglaze PA
Micro)n Technology, Inc.
Pham Thanh V.
LandOfFree
Gate coupling in floating-gate memory cells does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Gate coupling in floating-gate memory cells, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Gate coupling in floating-gate memory cells will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3716926