GaN substrate, substrate with epitaxial layer, semiconductor...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Fluid growth from gaseous state combined with preceding...

Reexamination Certificate

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C438S507000, C438S945000, C438S973000, C257SE21097

Reexamination Certificate

active

07816238

ABSTRACT:
A GaN substrate having a large diameter of two inches or more by which a semiconductor device such as a light emitting element with improved characteristics such as luminance efficiency, an operating life and the like can be obtained at low cost industrially, a substrate having an epitaxial layer formed on the GaN substrate, a semiconductor device, and a method of manufacturing the GaN substrate are provided. A GaN substrate has a main surface and contains a low-defect crystal region and a defect concentrated region adjacent to low-defect crystal region. Low-defect crystal region and defect concentrated region extend from the main surface to a back surface positioned on the opposite side of the main surface. A plane direction [0001] is inclined in an off-angle direction with respect to a normal vector of the main surface.

REFERENCES:
patent: 2005/0208687 (2005-09-01), Kasai et al.
patent: 2006/0043419 (2006-03-01), Tachibana et al.
patent: 2006/0086948 (2006-04-01), Ohno et al.
patent: 2006/0154451 (2006-07-01), Park
patent: 1 304 749 (2003-04-01), None
patent: 1 630 878 (2006-03-01), None
patent: 2003-60318 (2003-02-01), None
patent: 2003-183100 (2003-07-01), None
patent: 2003-238297 (2003-08-01), None
patent: 2005-298319 (2005-10-01), None
“News Release: Succeeded in LED Development on Semipolar Plane Bulk GaN Substrate”, Japanese Journal of Applied Physics, Jun. 30, 2006, Published by Kyoto University; and partial translation thereof.
Bruckner et al., “High Quality GaN Layers Grown on Slightly Miscut Sapphire Wafers”, Materials Research Society Symposium Proceedings, vol. 892, 2006, pp. 1-6.
Tuomisto et al., “Effect of Growth Polarity on Vacancy Defect and Impurity Incorporation in Dislocation-free GaN”, Applied Physics Letters, vol. 86, 2005, pp. 031915-1-031915-3.
Tengborn et al., “Effect of the Misorientation of the 4H-SiC Substrate on the Open Volume Defects in GaN Grown by Metal-Organic Chemical Vapor Deposition”, Applied Physics Letters, vol. 89, 2006; pp. 091905-1-091905-3.

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