Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – With lattice constant mismatch
Reexamination Certificate
2007-08-14
2011-10-18
Smith, Zandra (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
With lattice constant mismatch
C257S018000, C257S028000, C257SE29193, C257SE31035
Reexamination Certificate
active
08039869
ABSTRACT:
A gallium nitride device substrate comprises a layer of gallium nitride containing an additional lattice parameter altering element located over a substitute substrate.
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Corzine Scott W.
Lester Steven D.
Robbins Virginia M.
Haynes and Boone LLP
Perkins Pamela E
Smith Zandra
Taiwan Semiconductor Manufacturing Company , Ltd.
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