Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-08-01
2006-08-01
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S200000, C365S225700
Reexamination Certificate
active
07085182
ABSTRACT:
A fuse blowing interface (7) for a memory chip (1) comprising a latch register for latching a calculated memory repair solution when a prefuse request signal is received from an external tester device (8); and a fuse blowing unit with electrical fuses which are blown according to the calculated memory repair solution when a blow request signal is received from the external tester device (8).
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Collura Michel
Coste Jean-Patrice
Jallamion-Grive Yannis
Infineon - Technologies AG
Maginot Moore & Beck
Phung Anh
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