Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-12-14
2009-11-24
Wilczewski, M. (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S588000, C257S316000, C257S319000, C257S320000, C257SE29300, C257SE23145
Reexamination Certificate
active
07622349
ABSTRACT:
A method is provided which includes forming a first gate overlying a major surface of an electronic device substrate and forming a second gate overlying and spaced apart from the first gate. The method further includes forming a charge storage structure horizontally adjacent to, and continuous along, the first gate and the second gate, wherein a major surface of the charge storage structure is substantially vertical to the major surface of the substrate.
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Chindalore Gowrishankar L.
Hong Cheong M.
Sadd Michael A.
Freescale Semiconductor Inc.
Wilczewski M.
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