Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-02-21
2006-02-21
Weiss, Howard (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S513000
Reexamination Certificate
active
07001810
ABSTRACT:
The floating gate, or the oxide between the floating and control gates, or both are nitrided before the control gate layer is deposited.
REFERENCES:
patent: 4450553 (1984-05-01), Holster et al.
patent: 4613956 (1986-09-01), Paterson et al.
patent: 4644515 (1987-02-01), Allebest et al.
patent: 4860278 (1989-08-01), Nakahara
patent: 4960680 (1990-10-01), Pan et al.
patent: 5311494 (1994-05-01), Sugita et al.
patent: 5650344 (1997-07-01), Ito et al.
patent: 5661056 (1997-08-01), Takeuchi
patent: 5703868 (1997-12-01), Kobayashi et al.
patent: 5764619 (1998-06-01), Nishiuchi et al.
patent: 5847427 (1998-12-01), Hagiwara
patent: 6001713 (1999-12-01), Ramsbey et al.
patent: 6074954 (2000-06-01), Lill et al.
patent: 6127227 (2000-10-01), Lin et al.
patent: 6140024 (2000-10-01), Misium et al.
patent: 6248628 (2001-06-01), Halliyal et al.
patent: 6261903 (2001-07-01), Chang et al.
patent: 6261973 (2001-07-01), Misium et al.
patent: 6268296 (2001-07-01), Misium et al.
patent: 6274902 (2001-08-01), Kauffman et al.
patent: 6319775 (2001-11-01), Halliyal et al.
patent: 6362045 (2002-03-01), Lin et al.
patent: 6426305 (2002-07-01), Chou et al.
patent: 6459126 (2002-10-01), Mogami et al.
patent: 6653199 (2003-11-01), Zheng
patent: 6721046 (2004-04-01), Halliyal et al.
patent: 2001/0021588 (2001-09-01), Misium et al.
patent: 2002/0185675 (2002-12-01), Furukawa
patent: 2003/0183869 (2003-10-01), Crivelli et al.
patent: 2003/0232507 (2003-12-01), Chen
patent: WO 99/4559 (1999-09-01), None
M. Arai et al., “Remote Plasma Nitridation for Flash Tunnel Oxide,” Non-Volatile Semiconductor Memory Workshop 2001, pp. 125-127.
Chen Ching-Hwa
Dong Zhong
Jang Chuck
Gimlan Gideon
MacPherson Kwok & Chen & Heid LLP
Pizarro-Crespo Marcos D.
ProMOS Technologies Inc.
Weiss Howard
LandOfFree
Floating gate nitridation does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Floating gate nitridation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Floating gate nitridation will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3707638