Flat panel display with high capacitance and method of...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S238000, C438S155000, C438S149000

Reexamination Certificate

active

06878584

ABSTRACT:
A flat panel display device having a high capacitance and a high aperture ratio. A thin film transistor and a capacitor are formed on an insulating substrate. The thin film transistor includes a semiconductor layer, a gate electrode and source and drain electrodes. The capacitor has first and second capacitor electrodes and a dielectric layer. An insulating layer is formed over the transistor to insulate the gate electrode from the source and drain electrodes, and a portion of the insulating layer is formed as the dielectric layer between the first and second capacitor electrodes. A non-planar shape of the first capacitor electrode and a conforming shape of the dielectric layer and a second capacitor electrode increase a capacitance of the capacitor. The portion of the insulating layer serving as the capacitor dielectric is formed to be thinner than the portion of the insulating layer formed over the gate electrode.

REFERENCES:
patent: 6489176 (2002-12-01), Ninomiya
U.S. Appl. No. 10/095,111, filed Mar. 12, 2002, Seong-Moh Seo, Samsung SDI Co., Ltd.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Flat panel display with high capacitance and method of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Flat panel display with high capacitance and method of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flat panel display with high capacitance and method of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3435617

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.