Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-01-04
2005-01-04
Smith, Matthew (Department: 2825)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S264000, C438S267000, C365S185280
Reexamination Certificate
active
06838343
ABSTRACT:
A flash memory with a self-aligned spilt gate and the methods for fabricating and operating the same are described. The flash cell consists of a substrate having a deep n-type well and a shallow p-type well in the deep n-type well therein, a control gate structure on the gate oxide layer located on the p-type shallow well, a floating gate on one sidewall of the control gate and over the substrate, a tunnel oxide layer between the control gate and the floating gate and between the floating gate and the substrate, a drain and a common source disposed beneath each side of the control gate in the substrate, wherein the depth of the drain and the common source are larger than the depth of the shallow p-type well, a pocket p-type well in the substrate around the drain and electrically connecting with the shallow p-type well.
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Hsu Cheng-Yuan
Hung Chih-Wei
Jiang Chyun IP Office
Malsawma Lex H.
Powerchip Semiconductor Corp.
Smith Matthew
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