Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-05-25
2009-08-25
Smith, Zandra V. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S024000, C257S025000
Reexamination Certificate
active
07579646
ABSTRACT:
A flash memory cell includes a substrate and a gate structure formed on the substrate. The gate structure includes a tunneling layer over the substrate, a storage layer over the tunneling layer, a blocking layer over the storage layer, and a gate electrode over the dielectric. The storage layer preferably has a conduction band lower than a conduction band of silicon. The blocking layer is preferably formed of a high-k dielectric material.
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Chin Albert
Lai Chun-Hung
Ong Tong-Chern
Wang Ming-Tsong
Patton Paul E
Slater & Matsil L.L.P.
Smith Zandra V.
Taiwan Semiconductor Manufacturing Company , Ltd.
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