Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-05-06
2008-05-06
Smith, Zandra V. (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S429000, C438S360000
Reexamination Certificate
active
07368345
ABSTRACT:
Flash memory devices and methods of fabricating the same are disclosed. A disclosed method comprises doping at least one active region of a substrate, and forming an etching mask layer on the active region. The etching mask layer defines an opening exposing a portion of the active region. The disclosed method further comprises forming an etching groove in the active region. The etching groove separates a source region and a drain region. The disclosed method also comprises growing an epitaxial layer within the etching groove; forming a gate insulating layer on the epitaxial layer; depositing a first polysilicon layer on inner sidewalls of the opening and on the gate insulating layer; forming a dielectric layer on the first polysilicon layer; and depositing a second polysilicon layer on the dielectric layer.
REFERENCES:
patent: 4764480 (1988-08-01), Vora
patent: 5567635 (1996-10-01), Acovic et al.
patent: 6084265 (2000-07-01), Wu
patent: 6583466 (2003-06-01), Lin et al.
patent: 6587396 (2003-07-01), Jang
patent: 7037785 (2006-05-01), Dong et al.
patent: 7154144 (2006-12-01), Kim et al.
Dongbu Electronics Co. Ltd.
Saliwanchik Lloyd & Saliwanchik
Smith Zandra V.
Tran Thanh Y.
LandOfFree
Flash memory devices and methods of fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Flash memory devices and methods of fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flash memory devices and methods of fabricating the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2805759