Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-06-30
2008-12-30
Le, Thao X (Department: 2892)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257S314000, C257S316000, C257S324000, C257S330000, C438S270000, C438S282000, C438S296000
Reexamination Certificate
active
07470587
ABSTRACT:
A flash memory device includes trenches that are formed at regions on a semiconductor substrate spaced apart from one another at predetermined distances, buried floating gates buried into the trenches, a plurality of isolation structures formed between the buried floating gates, and a dielectric film and a control gate formed on the buried floating gates.
REFERENCES:
patent: 2002/0012745 (2002-01-01), Kanamori
patent: 10-2004-0051302 (2004-06-01), None
Hynix / Semiconductor Inc.
Le Thao X
Townsend and Townsend / and Crew LLP
Warrior Tanika
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