Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-07-03
2007-07-03
Booth, Richard A. (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257SE21179
Reexamination Certificate
active
11479051
ABSTRACT:
A non-volatile memory device has a gate dielectric film formed between a floating gate and a control gate. The gate dielectric film is formed by forming an oxide film and a ZrO2/Al2O3/ZrO2(ZAZ) film. Accordingly, the reliability of non-volatile memory devices can be improved while securing a high coupling ratio.
REFERENCES:
patent: 2006/0094191 (2006-05-01), Choi et al.
patent: 2007/0026608 (2007-02-01), Choi et al.
Hong Kwon
Jang Min Sik
Park Eun Shil
Booth Richard A.
Hynix / Semiconductor Inc.
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