Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-12-11
2007-12-11
Chaudhari, Chandra (Department: 2891)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S596000, C257SE21680
Reexamination Certificate
active
11158909
ABSTRACT:
A flash memory device includes control gates that are formed to completely surround the top and sides of floating gates. The control gates are located between the floating gates that are adjacent in the word line direction as well as the floating gates that are adjacent in the bit line direction. The present flash memory device reduces a shift in a threshold voltage resulting from interference among floating gates and increases an overlapping area of the floating gate and the control gates. Thus, there is an effect in that the coupling ratio can be increased.
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patent: 6432773 (2002-08-01), Gerber et al.
patent: 2002-0052611 (2002-07-01), None
patent: 2005-0038752 (2005-04-01), None
Chaudhari Chandra
Hynix / Semiconductor Inc.
Townsend and Townsend / and Crew LLP
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