Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-04-26
2011-04-26
Richards, N Drew (Department: 2895)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S400000, C438S238000, C438S239000, C438S386000, C438S389000, C257S324000, C257SE21679, C257SE27103, C257S295000, C257S296000, C257S314000, C257SE21209
Reexamination Certificate
active
07932147
ABSTRACT:
A flash memory device may include a device isolation layer and an active area formed over a semiconductor substrate, a memory gate formed over the active area, and a control gate formed over the semiconductor substrate including the memory gate, wherein the active area, where a source contact is to be formed, has the same interval spacing as a bit line, and a common source line area, where the source contact is to be formed, has an impurity area connecting neighboring active areas.
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Dongbu Hi-Tek Co., Ltd.
Richards N Drew
Sherr & Vaughn, PLLC
Singal Ankush k
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