Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-07-05
2011-07-05
Richards, N Drew (Department: 2895)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S287000, C257SE21423, C257SE21680
Reexamination Certificate
active
07972925
ABSTRACT:
The present invention relates to a flash memory device and a fabrication method thereof. A trench may be formed within a junction region between word lines by etching a semiconductor substrate between not only a word line and a select line, but also between adjacent word lines. Accordingly, the occurrence of a program disturbance phenomenon can be prevented as the injection of hot carriers into a program-inhibited cell is minimized in a program operation.
REFERENCES:
patent: 7414277 (2008-08-01), Melik-Martirosian et al.
patent: 7719049 (2010-05-01), Jeon et al.
patent: 2006/0001081 (2006-01-01), Sasago et al.
patent: 2006/0141710 (2006-06-01), Yoon et al.
patent: 2006/0291281 (2006-12-01), Wang et al.
patent: 2007/0166918 (2007-07-01), Oh et al.
patent: 08-172174 (1996-07-01), None
patent: 10-2006-0032860 (2006-04-01), None
patent: 10-0708907 (2007-04-01), None
patent: 10-2008-0015554 (2008-02-01), None
Jeon Yoo Nam
Kim Ki Seog
Diallo Mamadou
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
Richards N Drew
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