Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-06-26
2008-05-20
Gurley, Lynne (Department: 2811)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S211000, C438S257000, C438S266000, C438S260000, C438S262000, C257SE21205, C257SE21624
Reexamination Certificate
active
07374989
ABSTRACT:
Flash memory and methods of fabricating the same are disclosed. An illustrated example flash memory includes a first source formed within a semiconductor substrate; an epitaxial layer formed on an upper surface of the semiconductor substrate; an opening formed within the epitaxial layer to expose the first source; a floating gate device formed inside the opening; and a select gate device formed on the epitaxial layer at a distance from the floating gate device.
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Dongbu Electronics Co. Ltd.
Fortney Andrew D.
Gebremariam Samuel A
Gurley Lynne
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