Finfets having first and second gates of different...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S412000, C257S413000, C257SE29259

Reexamination Certificate

active

10937246

ABSTRACT:
A fin field effect transistor (FinFET) includes a first gate and a second gate. The first gate has a vertical part that is defined by sidewalls of a silicon fin and sidewalls of a capping pattern disposed on the silicon fin and a horizontal part horizontally extends from the vertical part. The second gate is made of a low-resistivity material and is in direct contact with the horizontal part of the first gate. A channel may be controlled due to the first gate, and a device operating speed may be enhanced due to the second gate. Related fabrication methods also are described.

REFERENCES:
patent: 5844278 (1998-12-01), Mizuno et al.
patent: 6413802 (2002-07-01), Hu et al.
patent: 7105934 (2006-09-01), Anderson et al.
patent: 2003/0113970 (2003-06-01), Fried et al.
Kedzierski et al.,Metal-Gate FinFET and Fully-Depleted SOI Devices Using Total Gate Silicidation,International Electron Devices Meeting, Dec. 8-11, 2002, pp. 247-250.
Yu et al.,FinFET Scaling to 100nm Gate Length,International Electron Devices Meeting, Dec. 8-11, 2002, pp. 251-254.

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