Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-11-29
2005-11-29
Dang, Phuc T. (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S595000, C257S346000
Reexamination Certificate
active
06969659
ABSTRACT:
A FinFET structure that prevents parasitic electrical leakages between its gate region and its fin region and between its gate region and its epitaxial region (source/drain regions). The structure is formed by first forming a fin region on top of an electrically insulating layer. Next, a gate stack having gate spacers thereon is formed on top of and electrically insulated from the fin region. Then, the final S/D (source/drain) regions are formed by epitaxially growing a semiconductor material from the two ends of the fin region not covered by the gate stack. Next, another electrically insulating layer is formed on top of the structure except the gate spacers. Next, the gate spacers and portions of the gate stack beneath them are replaced with a dielectric material.
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Anderson Brent A.
Nowak Edward J.
Dang Phuc T.
Sabo William D.
Schmeiser Olsen & Watts
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