Fin field effect transistor and method for forming the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S346000, C257S296000, C257S327000, C257SE29325, C257SE21620

Reexamination Certificate

active

07863683

ABSTRACT:
Example embodiments are directed to a method of forming a field effect transistor (FET) and a field effect transistor (FET) including a source/drain pair that is elevated with respect to the corresponding gate structure.

REFERENCES:
patent: 2003/0085424 (2003-05-01), Bryant et al.
patent: 2006/0244066 (2006-11-01), Yeo et al.
patent: 2007/0012997 (2007-01-01), Chung et al.
patent: 2007/0020902 (2007-01-01), Chung et al.
patent: 2007/0138523 (2007-06-01), Popp et al.

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