Film formation method and apparatus for forming...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

08034673

ABSTRACT:
A film formation method for a semiconductor process performs a film formation process to form a silicon-containing insulating film doped with a metal on a target substrate, in a process field inside a process container configured to be selectively supplied with a silicon source gas and a metal source gas. The method includes forming a first insulating thin layer by use of a chemical reaction of the silicon source gas, while maintaining a shut-off state of supply of the metal source gas; then, forming a first metal thin layer by use of a chemical reaction of the metal source gas, while maintaining a shut-off state of supply of the silicon source gas; and then, forming a second insulating thin layer by use of the chemical reaction of the silicon source gas, while maintaining a shut-off state of supply of the metal source gas.

REFERENCES:
patent: 2005/0208714 (2005-09-01), Yamazaki et al.
patent: 2006/0286817 (2006-12-01), Kato et al.
patent: 2008/0085610 (2008-04-01), Wang et al.
patent: 6-45256 (1994-02-01), None
patent: 11-87341 (1999-03-01), None
patent: 2006-229233 (2006-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Film formation method and apparatus for forming... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Film formation method and apparatus for forming..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Film formation method and apparatus for forming... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4296620

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.