Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-09-05
2010-10-19
Wilczewski, Mary (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S586000, C438S595000, C438S655000, C438S683000, C257S384000, C257S408000, C257SE21439
Reexamination Certificate
active
07816219
ABSTRACT:
A semiconductor structure and method for forming the same. First, a semiconductor structure is provided, including (a) a semiconductor layer including (i) a channel region and (ii) first and second source/drain (S/D) extension regions, and (iii) first and second S/D regions, (b) a gate dielectric region in direction physical contact with the channel region via a first interfacing surface that defines a reference direction essentially perpendicular to the first interfacing surface, and (c) a gate region in direct physical contact with the gate dielectric region, wherein the gate dielectric region is sandwiched between and electrically insulates the gate region and the channel region. Then, (i) a first shallow contact region is formed in direct physical contact with the first S/D extension region, and (ii) a first deep contact region is formed in direct physical contact with the first S/D region and the first shallow contact region.
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patent: 2002/0008295 (2002-01-01), Yang et al.
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patent: 2003/0183881 (2003-10-01), Lee et al.
Chen Xiangdong
Fang Sunfei
Luo Zhijiong
Yang Haining
Zhu Huilong
Brown Katherine
International Business Machines - Corporation
Schmeiser Olsen & Watts
Thomas Toniae M
Wilczewski Mary
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