Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-03-09
2009-12-08
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S206000, C438S214000, C438S350000, C438S357000, C438S360000, C257SE21419, C257SE21428
Reexamination Certificate
active
07629211
ABSTRACT:
A method of forming a field effect transistor comprises providing a semiconductor substrate, a gate electrode being formed over the semiconductor substrate. At least one cavity is formed adjacent the gate electrode. A strain-creating element is formed in the at least one cavity. The strain-creating element comprises a compound material comprising a first chemical element and a second chemical element. A first concentration ratio between a concentration of the first chemical element in a first portion of the strain-creating element and a concentration of the second chemical element in the first portion of the strain-creating element is different from a second concentration ratio between a concentration of the first chemical element in a second portion of the strain-creating element and a concentration of the second chemical element in the second strain-creating element.
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Beyer Sven
Horstmann Manfred
Kammler Thorsten
Stephan Rolf
Advanced Micro Devices , Inc.
Ahmadi Mohsen
Garber Charles D
Williams Morgan & Amerson P.C.
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